X-ray Von Hamos Inspection Experimental Station

The X-ray Von Ham os detection experiment station mainly includes: The ternary analysis crystal adjustment mechanism, detector adjustment mechanism and sample adjustment mechanism are installed in the vacuum cavity. The characteristic spectrum is obtained through wavelength dispersion, which is used to study the components, valence state, spin state and ligand identification of elements.

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Experiment station system

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产品介绍

设备特点

应用简介

Product Introduction

Main parameters

part	serial number	Part Name	Technical indicators
part	serial number	Part Name	Travel range	resolution	Repeatability
Analyzing the Crystal Adjustment Mechanism	I-1	Swing angle φi	±135°	0.001°	0.002°
	1-2	Inclination angle θi	±10°	0.001°	0.002°
	I-3	Vertical translation Zi	-30, 190mm	0.5μm	1μm
	1-4	Translation Xi in vertical optical path direction	-40, 260mm	0.5μm	1μm
Detector adjustment mechanism	I-1	Vertical translation Zd	-25, 375mm	0.5μm	1μm
	II-2	Translation in the direction of the optical path Yd	±30mm	0.5μm	1μm
	II-3	Inclination angle θd	±135°	0.001°	0.002°
Sample stage part	II-1	Vertical translation direction Zs	±30mm	0.5μm	1μm
	II-2	Translation in vertical optical path direction Xs	±30mm	0.5μm	1μm
	II-3	Light path direction translation Ys	±30mm	0.5μm	1μm
	III-4	Swing angle Rs	±175°	0.001°	0.002°