X-ray absorption fine structure (XAFS) spectrometer

XAFS mainly measures the absorption rate changes at and near the K/L absorption edge of elements, and is widely used to diagnose the local characteristics of materials, such as the valence state, coordination number, configuration and bond length of core atoms.

Category：

X-ray spectroscopy

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产品介绍

设备特点

应用简介

XAFS spectrum

XANES

X-ray absorption near-edge structure spectroscopy

Measure the spectrum from about 10 eV before the absorption edge of a specific atom to about 50 eV after the absorption edge.

EXAFS
Extended X-ray Absorption Fine Structure Spectroscopy

Measures the spectrum from 50eV to 1000eV after the atomic absorption edge

Product Introduction

The Table XAFS-500 spectrometer system adopts a Rowland circle structure and large-sized curved crystal components, and uses conventional X-ray sources to achieve spectral measurement of Testable” XAFS freedom.

Product Features

● Supports near-side quick scan function
● One-click automatic switching between different samples and different measurement modes
● Supports extended functions such as in-situ testing
● Remote data transmission, real-time display of experimental progress and results Supports unattended testing
● Human body Highly engineered, more convenient to operate
● Professional application technology support and data analysis support
● Built-in patented software and preset experimental parameters to achieve fast measurement
● The instrument has radiation exemption qualifications and multiple safety protection interlocks to ensure that people Safety in body and use

Main parameters

energy range	4.5~20keV
energy resolution	0.5~1.5 eV (7~9keV, near edge)
X-ray light source	1.2~1.6kW closed tube
Luminous flux	1×10 ⁶ ~2×10 ⁶ photons/sec@9keV
monochromator crystal	Diameter 100mm, spherical radius 500mm (Si/Ge)
detector	SDD detector
Automatic sample wheel	16 workstations